Download Advances in X-Ray Analysis: Volume 37 by Ron Jenkins (auth.), John V. Gilfrich, Ting C. Huang, I. PDF

By Ron Jenkins (auth.), John V. Gilfrich, Ting C. Huang, I. Cev Noyan, Paul K. Predecki, Charles C. Goldsmith, Ron Jenkins, Deane K. Smith (eds.)

89 articles equipped less than the next part heads: effect of pcs on Xray research. purposes of entire development becoming: constitution choice, section identity, Lattice Parameters. Search/Match equipment, section id. Diffraction from unmarried Crystals and Epitaxial motion pictures. Xray Characterization of movies and floor Layers. pressure and rigidity decision, Xray Fractography, Diffraction height Broadening research. Advances in Detectors and Counting Electronics. XRD concepts and Instrumentation, Nonambient functions, Texture, different functions. Xray Optics, Monochromators and artificial Multilayers. overall mirrored image XRF purposes and Instrumentation, different XRF strategies and Instrumentation. Mathematical ideas in Xray Spectrometry. Geological and different functions of XRS. Index.

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There is no need for their coefficients to represent any real physical parameters. Such fit-functions often constitute a better match with the experiment than the theoretical models depending on how well the model describes the actual real experimental situation and to what extent all real interactions in the specimen are included by the model. Sometimes the empirical relationships can even be used in situations which cannot be accurately described by theoretical models, for example specimens with (equally) rough surfaces, or (equally prepared) powders.

Quantitative x-ray fluorescence analysis based upon empirical or theoretical methods has developed into a field of its own. Optimized procedures for the widespread and specialized applications of XRF ha~ led to a number of dedicated software products. At the same time, advanced user surfaces as well as the improved theoretical treatment of interelement effects and interactions in real specimens made such software quite complex. Algorithms for raw spectra refinement in XRF, such as profile fitting for the accurate determination of peak positions and peak intensities as well as for the separation of overlapped peaks, proceed primarily from the impressive progress of such methods in x-ray diffractometry, but appear to be implemented at rather plain levels in some commercial packages.

New York, 1994 27 28 II. APPLICATIONS OF WHOLE PATTERN FITTING hex) profiles by the instrumental g(x) profiles, in order to obtain the parameters of the intrinsic fix) profiles due to the microstructure of the material. k(x) gk(X-y) dy (1) In pattern decomposition methods hk(X) is an analytical reflection profile function, generally selected from flexible functions: Pearson VII, pseudo-Voigt and Voigt. In the refinement process the quantity minimized is, as usual, the sum of the squares of the differences between observed and calculated values of the intensities.

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